Jan 1, 2020. | By: Joanna C. S. Santos

Our work, “Looking for Software Defects? First Find the Nonconformists - An Outlier-Based Defect Prediction Approach”, was published in 20th IEEE International Working Conference on Source Code Analysis and Manipulation.

Publication details, authors, citation information, and available resources are provided below.

Related Links

• Preprint
• Presentation
• 10.1109/SCAM51674.2020.00014

BibTeX

@inproceedings{moshtari2020looking,
  author={Moshtari, Sara and Santos, Joanna C. S. and Mirakhorli, Mehdi and Okutan, Ahmet},
  booktitle={2020 IEEE 20th International Working Conference on Source Code Analysis and Manipulation (SCAM)}, 
  title={Looking for Software Defects? First Find the Nonconformists}, 
  year={2020},
  volume={},
  number={},
  pages={75-86},
  doi={10.1109/SCAM51674.2020.00014}
}

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